RE: [PIUG List] Graphing/Mapping of Patent Data

To learn about the STN AnaVist analysis and visualization tool, you can
find information on the
CAS website at
http://www.cas.org/support/stna/index.html

Please note also that our support staff is available to help with the
use of all STN and CAS products. They can be reached by sending a
message to help_at_cas.org or by calling 800-753-4227.

Eric Shively
CAS

-----Original Message-----
From: Anthony Trippe [mailto:tony_at_trippe.com]
Sent: Wednesday, August 20, 2008 9:42 AM
To: PIUG Discussion List @ Listbox
Subject: Re: [PIUG List] Graphing/Mapping of Patent Data

Hello Christopher,

Can you tell us a little bit more about what you are looking for in
particular?

With regards to bar charts (histograms) and matrix charts I am partial
to VantagePoint and Analyze Plus on STN. There are advantages of one
over the other depending on your data sources, how often you will be
doing this sort of work, the amount of money you have to spend and how
much flexibility you need.

It is a little dated but I wrote an article for World Patent Information
a few years ago entitled Patinformatics: Tasks to Tools which went
through the various options available at the time (Google the title for
access). Analyze Plus was not available at the time so is not included
but several other tools are described.

If you need more advanced analytics you can also look at STN AnaVist
which includes mapping and dynamic interoperability to the standard bar
charts and matrix charts. There are other products that include mapping
but they are generally subscription based. STN AnaVist is transactional
with regards to pricing.

Of course, in the spirit of full disclosure I need to mention that I
used to work at CAS (Responsible for STN International in the
Americas) and was on the development teams for Analyze Plus and STN
AnaVist.

I hope this helps and please let me know if I can be of further
assistance.

Best regards,
Tony Trippe

On Aug 20, 2008, at 9:13 AM, McLaughlin, Chris wrote:

> I use Delphion for my patent searching and like the Snapshot feature,
> but it is not flexible enough. Without spending $30k on features I use

> a handful of times a year, what are your recommendations for graphing
> patent data?
> Regards,
>
> Christopher J. McLaughlin
> Intellectual Property Counsel
> Rudolph Technologies, Inc.
> 4900 West 78th St.
> Bloomington, MN 55435
> Phone: 952-259-1612
> Facsimile: 952-259-1817
>
>
>
>
>
>
>
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Received on Wed Aug 20 2008 - 16:52:14