Questel at the PIUG NE Conferences – New Brunswick, NJ – USA – Tuesday, October 13, 2015

Nancy Lee, Manager of training and IP education at QUestel presented the following subject in the plenary session.

Taking Patent Analysis to the Next Level – Using Multiple Patent Quality Metrics to Support Strategic Decisions for a Patent Portfolio.

Short abstract:
While competitive benchmarking has been around for many years, comparing portfolios can be complicated and manually time-consuming.

But it remains necessary to do this, as well as assessing your legal risk to operate, in order to exclude others from entering your specific space.
The multiple metrics can then be illustrated easily via charts, graphs, or other reporting techniques to reveal trends previously undetected.

Questel IP Trainings Specialist, Joe Terlizzi and Nancy Lee presented at the Questel Workshop the new ins and outs of Orbit in :

What’s New on Orbit.Com?

See and have explained the latest enhancements at Questel.

Including :

  • Search module including a simple text entry box accepting numbers, assignees, and keywords.
  • Citation and family tree charts with new features.
  • Analysis features in IPBI including new assignee features and classifying assignees with licensing and security interests.
  • Semantic Search finding patents based on similar content.

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